Oleg Soloviev
Oleg Soloviev
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Jacques Noom
Latest
Proximal-based recursive implementation for model-free data-driven fault diagnosis
Data-Driven Fault Diagnosis under Sparseness Assumption for LTI Systems
High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction
Increase of wafer inspection tool throughput with computational imaging
Closed-loop active object recognition with constrained illumination power
Particle detection using closed-loop active model diagnosis
Phase retrieval from overexposed PSF: a projection-based approach
Closed-Loop Active Model Diagnosis Using Bhattacharyya Coefficient: Application to Automated Visual Inspection
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